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NI: Path leads to parallel for test and measurement
Posted: Apr 16, 2008 3:17 PM

Actions, computing and instructions occurring simultaneously are increasingly common requirements in...[ View complete article ]


Message: NI: Path leads to parallel for test and measurement Post time: Apr 16, 2008 3:17 PM
 

Author: ATPV

Level: Interns

Points: 475

Actions, computing and instructions occurring simultaneously are increasingly common requirements in today's world, as evidenced by the unstoppable migration from single-core to multicore processors in PCs. This new paradigm—the Parallel Shift—brings a huge challenge to test engineers: the marriage of parallelism with computing, and in related applications of measurement and control.
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( 1 ) Reply:NI: Path leads to parallel for test and measurement Post time: Apr 16, 2008 3:17 PM
 

Author: ATPV

Level: Interns

Points: 475

I learned a lot from attending this event. Indeed, test and instrumentation is a factor in the transition to multicore. I do hope that our technology will reap the benefits of parallel processing technologies discussed here.
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