Global Sources
EE Times AsiaWebsite
Home | Login | Register Now  
[ May 12, 2008  ]
Categories:  Advanced Search | Help
Demystifying Vietnam
After China and India, all eyes are now on Vietnam. What is the lure of this market? What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there? Join now this forum and share your thoughts on what is the real deal with Vietnam, its potential and future.
 


Post new message Post new message 
Message: SPC software tool from Vietnam
Post time: May 8, 2008 10:58 AM
 


Author: huynhquochung
Level: Interns
Points: 235

SiGlaz provides manufacturers of ICs, magnetic media and flat panel displays with intelligent software to increase productivity and yield. SiGlaz spatial signature analysis (SSA) software analyzes large volumes of data generated by in-line inspection and metrology tools to determine the root cause of manufacturing problems in seconds.

SIGLAZ PRODUCT OVERVIEW

Intelligent Defect Analysis
SiGlaz’ Intelligent Defect Analysis (IDATM) software provides semiconductor fabs with an automatic excursion monitoring capability that integrates seamlessly into existing yield management architecture to provide immediate value-added functionality. IDA monitors inspection results files (KLARF) in production and automatically recognizes spatial defect signatures resulting from equipment failure and process excursions.
IDA is a Spatial Signature Analysis software, and it may be integrated into the fabrication process to identify concentrated defect signatures (e.g., scratches or micro-scratches) or to identify distributed defect signatures, such a those resulting from the failure of a process tool. The software integrates into the fab’s data base management and SPC system; it is compatible with advanced Microsoft .NET framework and XML format.
SiGlaz Software also provides engineering resources to customize the software for specific customer applications.

Defect Signature Analyzer - DSA™
Defect Signature Analyzer provides the yield engineer with a wide range of analysis and visualization tools with which to develop and optimize the defect signature analysis methodology and to train the defect signature library.

Benefit - Provide effective way to build a defect signature/root-cause library.

Automation Workbench – AWB™
Automation Workbench allows the engineer to automate the signature analysis methodology to run in either batch mode or continuous monitor mode. An easy-to-use graphical interface allows the user to develop custom analysis recipes that enhance signature recognition accuracy and purity

Benefit - Build complex analysis recipes or work flows using software agent with visual programming.

Intelligent Reporting System – IRS™
Intelligent Reporting System is a software package that allows the user to effectively view, analyze and report on the multi-dimensional defect signature variables that are generated by AWB recipes.

Benefit - Provide effective way to identify defect trends that occur in production data over time.
Source: http://www.siglaz.com

huynhquochung edited at May 8, 2008 11:35 AM
Comment the post Comment    Click to reply Reply   Quote previous post in reply Reply with quote   watch this thread Watch   Recommend the post Recommend 
Post new message Post new message
--- Total 0 reply, 1 page, now on page 1 ---


Score List
 

Back

eMedia Asia EE Times - India | | |
Global Sources | Electronic Components | Computer Products | Trade Show Center | China Sourcing Fairs
CMP EE Times | ESM Online
 
 
RSS Feed | Site Feedback | Site Map | Help | About Us | Contact Us | Terms of Use | Privacy Policy | Security Commitment
Copyright © 2008 eMedia Asia Ltd. All rights reserved. Reproduction in whole or in part in any form or medium without the express written permission of eMedia Asia Ltd. is prohibited. Warning: The images on this site are protected by digital watermark technology. Your use of this website is subject to, and constitutes acknowledgement and acceptance of our Terms of Use.